Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/149Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Srijith, S.; Asitha, L. R. | - |
| dc.date.accessioned | 2022-07-05T07:13:34Z | - |
| dc.date.available | 2022-07-05T07:13:34Z | - |
| dc.date.issued | 2021 | - |
| dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/149 | - |
| dc.title | X-ray diffraction line profile analysis of Ce substituted Gd2Zr2O7 system (Gd2-xCex) Zr2O7 (x = 0,2) | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | Faculty Publications | |
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